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Home Research [J.30] Advanced qualification method for patterns with irregular edges in printed electronics

[J.30] Advanced qualification method for patterns with irregular edges in printed electronics

Research / System Integration 系統整合
[J.30] Advanced qualification method for patterns with irregular edges in printed electronics
Research / System Integration 系統整合

[J.30] Advanced qualification method for patterns with irregular edges in printed electronics

Shao-Min Hsu and Cheng-Yao Lo
Flexible and Printed Electronics, Vol. 4, 015001 (2019)

doi:10.1088/2058-8585/aaf311

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